Our Story

Accelerated Reliability Solutions L.L.C demonstrates and guides electronics and electro-mechanical systems design companies and manufacturers on the most efficient and effective reliability development strategy, tools, methods, and solutions to rapidly discovering the causes and preventing flaws from getting to your customers.We offer training and seminars on shorter more comprehensive testing using inherent strength in electronics systems

Experienced - Decades of Electronics Manufacturing and Testing

The founder and Principal Consultant, Kirk Gray,  has over thirty plus years of experience in the electronics manufacturing industry.  Mr. Gray began his career in electronics at the semiconductor fabrication process level,  followed the path of the  manufacturing process to larger systems, and improving the efficiency of latent defect testing for reliability during of subsystem and system level personal computer (PC)  development.

As the Environmental Stress Screening (ESS) Process Engineering Manager in manufacturing test at Storage Technology from 1989 to 1992, he worked with Dr. Gregg K. Hobbs, the inventor of the terms and techniques of Highly Accelerated Life Test (HALT) and Highly Accelerated Stress Screening (HASS).  Mr. Gray's ESS process engineering team applied the HALT and HASS process and procedures into existing manufacturing production of data storage systems. He recognized, documented and promoted the tremendous benefits of HALT and HASS in the design and production of electronics and electro-mechanical systems.

Mr. Gray has documented results of reduced warranty return rates from 5% to 0.5% after new HALT and HASS test processes were applied. With this 90% reduction in warranty returns, reliability testing was reduced from 72 hours to one (1) hour. He developed recommendations for maintenance and improvement of accelerated reliability screening methods for continued production test efficiency.

From 2003 until 2010 he was a Sr. Reliability Engineer at Dell, Inc. where he created new HALT based test processes for desktop and portable computers. He created, wrote and implemented the HALT to HASA process on power supply systems. The HASA process was recognized for being the highest ROI (Return on Investment) many ongoing reliability processes for its ability to rapidly detect process excursions.  

In 2010, Kirk founded Accelerated Reliability Solutions, L.L.C., a consulting company to assist and guide electronics manufacturers in practical application of HALT and HASS methods. Accelerated Reliability Solutions has presented webinars for Qualmark and Hobbs Engineering Companies.

Kirk co-authored the book with John J. Paschkewitz,  Next Generation HALT and HASS: Robust Design of Electronics and Systems, Published in 2016 by John Wiley and Sons ISBN: 978-1-118-70023-5

Please click on this link to connect to book site to purchase

He earned a Bachelor of Science degree in Electrical Engineering from the University of Texas at Austin in1982.