Here are some useful links for additional Accelerated Stress Testing information

NO MTBF blog site created by Fred Schenkelberg dedicated to removing the use of the term MTBF in reliability engineering. Our first Blog Post "No Evidence of Correlation: Field Failures and Traditional Reliability Engineering" can be found by clicking HERE for the link.

2012 IEEE/CPMT Workshop on Accelerated Stress Testing and Reliability (ASTR). To be held October 17-19, 2012 at the Holiday Inn Downtown Centre in Toronto, Ontario, Canada.

IEEE/CPMT Committee on Accelerated Stress Testing and Reliability - the IEEE organization most focused on using HALT and HASS methods and stress testing techniques for reliability testing and screening, The committee puts on a annual Workshop to share information and new developments in the world of HALT and HASS.

Here is a link to the latest presentations made at the 2010 IEEE/CPMT ASTR Workshop 

University of Maryland's CALCE - The Center for Advanced Life Cycle Engineering (CALCE), the largest electronic products and systems research center focused on electronics reliability, is dedicated to providing a knowledge and resource base to support the development of competitive electronic components, products and systems.