Accelerated Reliability Solutions, LLC.

Welcome to Accelerated Reliability Solutions Website.

We are a consulting service dedicated to leading electronics manufacturers to a new perspective and new practical methods of reliability development and ongoing reliability testing that will result in mature electronics systems at market release!

 

We will introduce your company or team to the HALT and HASS methodology or provide advanced enhancements and usage of HALT and HASS to provide a higher precipitation and detection of hardware latent defects as well as the benefits to help more rapidly debug software/firmare during new product development.

 

We show how to apply the Physics of Failure approach to electronic reliability development will result in reduced development time, warranty costs, and the best product reliability at market release.

 

New Article: Find our most recent paper  at this link "Long-term Thermal Overstressing of Computers"  just published in Nov/Dec 2011 issue of IEEE Design and Test of Computers

 

Accelerated Reliability Solutions Provides...

 

  • Electronics systems manufacturers the most efficient and effective reliability development strategy, tools, methods, and solutions to preventing electronics failures
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  • Training on shorter more comprehensive testing using inherent strength in electronics systems
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  • Subsitute stress for sample size and find out more "weak links" faster
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  • Resulting in the highest reliability electronic and electro-mechanical systems
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  • Finishing with robust products at lower development costs and delighted customers!

 

Rapidly reduce warranty returns and develop the most effective testing to uncover and detect future field failure mechanisms in the test lab

 

With our direction and guidance in new testing paradigms, companies that have been clients have achieved a 90% reduction of warranty returns over traditional methods.

 

We teach and guide efficient accelerated stress testing and analysis based on your products use environment, the Physics of Failure and the design's inherent stress/strength capabilities.

 

Let us help you adopt a new reliability paradigm for the 21st century based on engineering, material science and the hidden strength of today's electronics hardware.